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arXiv:2506.13909cs.LG

Few-Shot Learning for Industrial Time Series: A Comparative Analysis Using the Example of Screw-Fastening Process Monitoring

Xinyuan Tu

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Abstract

Few-shot learning (FSL) has shown promise in vision but remains largely unexplored for \emph{industrial} time-series data, where annotating every new defect is prohibitively expensive. We present a systematic FSL study on screw-fastening process monitoring, using a 2\,300-sample multivariate torque dataset that covers 16 uni- and multi-factorial defect types. Beyond benchmarking, we introduce a \textbf{label-aware episodic sampler} that collapses multi-label sequences into multiple single-label tasks, keeping the output dimensionality fixed while preserving combinatorial label information. Two FSL paradigms are investigated: the metric-based \emph{Prototypical Network} and the gradient-based \emph{Model-Agnostic Meta-Learning} (MAML), each paired with three backbones: 1D CNN, InceptionTime and the 341 M-parameter transformer \emph{Moment}. On 10-shot, 3-way evaluation, the InceptionTime + Prototypical Network combination achieves a \textbf{0.944 weighted F1} in the multi-class regime and \textbf{0.935} in the multi-label regime, outperforming finetuned Moment by up to 5.3\% while requiring two orders of magnitude fewer parameters and training time. Across all backbones, metric learning consistently surpasses MAML, and our label-aware sampling yields an additional 1.7\% F1 over traditional class-based sampling. These findings challenge the assumption that large foundation models are always superior: when data are scarce, lightweight CNN architectures augmented with simple metric learning not only converge faster but also generalize better. We release code, data splits and pre-trained weights to foster reproducible research and to catalyze the adoption of FSL in high-value manufacturing inspection.

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arXiv admin comment: This version has been removed by arXiv administrators as the submitter did not have the rights to agree to the license at the time of submission
Journal reference
DOI
Subjects
cs.LGMachine Learning

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