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arXiv:1811.05772cs.ET

SLIM: Simultaneous Logic-in-Memory Computing Exploiting Bilayer Analog OxRAM Devices

Sandeep Kaur Kingra, Vivek Parmar, Che-Chia Chang, Boris Hudec, Tuo-Hung Hou, Manan Suri

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Abstract

Von Neumann architecture based computers isolate/physically separate computation and storage units i.e. data is shuttled between computation unit (processor) and memory unit to realize logic/ arithmetic and storage functions. This to-and-fro movement of data leads to a fundamental limitation of modern computers, known as the memory wall. Logic in-Memory (LIM) approaches aim to address this bottleneck by computing inside the memory units and thereby eliminating the energy-intensive and time-consuming data movement. However, most LIM approaches reported in literature are not truly "simultaneous" as during LIM operation the bitcell can be used only as a Memory cell or only as a Logic cell. The bitcell is not capable of storing both the Memory/Logic outputs simultaneously. Here, we propose a novel 'Simultaneous Logic in-Memory' (SLIM) methodology that allows to implement both Memory and Logic operations simultaneously on the same bitcell in a non-destructive manner without losing the previously stored Memory state. Through extensive experiments we demonstrate the SLIM methodology using non-filamentary bilayer analog OxRAM devices with NMOS transistors (2T-1R bitcell). Detailed programming scheme, array level implementation and controller architecture are also proposed. Furthermore, to study the impact of introducing SLIM array in the memory hierarchy, a simple image processing application (edge detection) is also investigated. It has been estimated that by performing all computations inside the SLIM array, the total Energy Delay Product (EDP) reduces by ~ 40x in comparison to a modern-day computer. EDP saving owing to reduction in data transfer between CPU Memory is observed to be ~ 780x.

arXiv comments
Journal reference
Sci Rep 10, 2567 (2020)
DOI
doi:10.1038/s41598-020-59121-0
Subjects
cs.ETEmerging Technologies

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